November 27 (Wed)
WeA3
Reliability Analysis 1
Oral,
Jade Hall A,
08:40~09:25
Moderator:
  • Prof. Hongjun Yu, Harbin Inst. of Technology
190390
08:40~08:55
Reliability Prediction of Gate Dielectrics Based on Percolation Models Using Fractal Structure
Seong-joon Kim* (Chosun Univ.), Man Soo Kim (LIG Nex1), Suk Joo Bae (Hanyang Univ.)
Paper : 190390.pdf
190389
08:55~09:10
Statistical Analysis Method for Assessing Drop-shock Reliability of OLED Module for Portable Devices
Seong-joon Kim* (Chosun Univ.), Byeong Min Mun (Hanyang Univ.), Daeil Kwon (Konkuk Univ.), Suk Joo Bae (Hanyang Univ.)
Paper : 190389.pdf
190316
09:10~09:25
Temperature History Estimation Method for Individual Junction Box Based on Meteorological Data
Dong-Cheon Baek*, Na-Hyun Kim, Tae-Hyun Lee, Kyungha Ryu, Jong-Won Park (Korea Inst. of Machinery and Materials)
Paper : 190316.pdf